SNE-4500GDesktop scanning electron microscope SEM

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A. Technical parameters
1. Resolution: 5nm (30kV, SE Image)
2. Magnification ratio: 30x~100000x (effective magnification ratio 60000x)
3. Acceleration voltage:
5kV to 30kV (5Kv/10Kv/15kV/20kV/30Kv-5 step)
4. Image:
Secondary Electron Image (SEI) - Secondary Electron Image
5. Observation mode: Standard Mode
6. Electronic gun system:
Filament type: pre aligned tungsten filament
Bias system: automatic bias mode
Electronic gun calibration: manual mode
7. Lens composition
i. Focusing lens: 2-stage magnetic coil lens
Ii. Objective lens: 1-segment magnetic coil lens
8. Detector type
E-T Detector
9. Stage system: 5-axis control
- X, Y-axis : 40mm / R-axis : 360°
- Z : 0~35mm / Tilt-axis : 0~45°
10. Image shift: X, Y Image Shift (100?)
11. Sample size:
80mm in diameter, 35mm in height

SNE-4500GDesktop scanning electron microscope SEM

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